Sheng Hu

1 ta ish

IBM (United States)

1. EVIDENCE OF HOLE INJECTION AND TRAPPING IN SILICON NITRIDE FILMS PREPARED BY REACTIVE SPUTTERING

   Sheng Hu, D. R. Kerr, L. V. Gregor

   Maqola19672 iqtibos

   ABIABI:AkademIndex/2026.other.568589