W. E. Tennant

1 ta ish

Rockwell Automation (United States)

1. Raman scattering studies of monolayer-thickness oxide and tellurium films on PbSnTe

   J. A. Cape, Leonard G. Hale, W. E. Tennant

   Maqola19773 iqtibos

   ABIABI:AkademIndex/2026.other.364392