E. Maydell-Ondrusz

1 ta ish

Institute of Nuclear Physics

1. Backscattering measurements of postimplantation damage profiles in silicon single crystals

   S. Kopta, E. Maydell-Ondrusz, Β. Rajchel

   MaqolaCrystallography and Radiation Phenomenaphysica status solidi (a)19780 iqtibos

   ABIABI:AkademIndex/1978.article.000065