M. P. Seah

4 ta ish

National Physical Laboratory

1. Practical surface analysis: By auger and x-ray photoelectron spectroscopy

   D. Briggs, M. P. Seah

   Kitob19837 iqtibos

   ABIABI:AkademIndex/2026.other.182600

2. Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids

   M. P. Seah, W. A. Dench

   Maqola19793 iqtibos

   ABIABI:AkademIndex/2026.other.107641

3. Cluster ion sputtering: molecular ion yield relationships for different cluster primary ions in static SIMS of organic materials

   M. P. Seah

   Maqola20073 iqtibos

   ABIABI:AkademIndex/2026.other.415072

4. Analysis of cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometry

   M. P. Seah

   Maqola20072 iqtibos

   ABIABI:AkademIndex/2026.other.426047