V. E. Kopina

1 ta ish

Fizika-Texnika Instituti

1. Relationship of electrical resistance of polycrystalline tin films to structural characteristics

   Б. И. Белевцев, Yu. F. Komnik, V. E. Kopina +1

   MaqolaCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics19801 iqtibos

   ABIABI:AkademIndex/2026.other.603988