R. F. De Keersmaecker

1 ta ish

Catholic University of Leuven

1. A reliable approach to charge-pumping measurements in MOS transistors

   G. Groeseneken, H.E. Maes, N. Beltran +1

   Maqola19842 iqtibos

   ABIABI:AkademIndex/2026.other.666131