G. Groeseneken

2 ta ish

Catholic University of Leuven

1. Origin of NBTI variability in deeply scaled pFETs

   B. Kaczer, Tibor Grasser, Ph. Roussel +6

   Maqola20103 iqtibos

   ABIABI:AkademIndex/2026.other.536298

2. A reliable approach to charge-pumping measurements in MOS transistors

   G. Groeseneken, H.E. Maes, N. Beltran +1

   Maqola19842 iqtibos

   ABIABI:AkademIndex/2026.other.666131