Greg Gillen

5 ta ish

National Institute of Standards and Technology

1. Secondary Ion Mass Spectrometry SIMS XI

   Greg Gillen, R. T. Lareau, J. Bennett +1

   Maqola20033 iqtibos

   ABIABI:AkademIndex/2026.other.520636

2. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry

   Christine M. Mahoney, Sonya Roberson, Greg Gillen

   Maqola20043 iqtibos

   ABIABI:AkademIndex/2026.other.616706

3. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

   Greg Gillen, Sonya Roberson

   Maqola19982 iqtibos

   ABIABI:AkademIndex/2026.other.493026

4. Secondary ion mass spectrometry using cluster primary ion beams

   Greg Gillen, Albert J. Fahey

   Maqola20022 iqtibos

   ABIABI:AkademIndex/2026.other.613674

5. A reappraisal of current methods for the assessment of planar gamma camera performance

   Wendy A. Waddington, Gwen Clarke, Kathleen J. Barnes +3

   MaqolaMedical Imaging Techniques and ApplicationsNuclear Medicine Communications19950 iqtibos

   ABIABI:AkademIndex/1995.article.000081