T. Nishimiya

1 ta ish

Fizika-Texnika Instituti

1. Correlation Between Surface Morphology and Lattice Orientation of Microcrystalline Silicon

   Michio Kondo, T. Nishimiya, K. Saitoh +2

   MaqolaThin-Film Transistor TechnologiesMRS Proceedings19970 iqtibos

   ABIABI:AkademIndex/1997.article.000053