Eun Dong Kim

1 ta ish

Korea Electrotechnology Research Institute

1. Structural and Electrical Quality of Silicon Bicrystals Fabricated by a Modified Direct Bonding Technique

   T. S. Argunova, M. Yu. Gutkin, L. S. Kostina +3

   MaqolaThin-Film Transistor TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena19990 iqtibos

   ABIABI:AkademIndex/1999.article.000171