Structural and Electrical Quality of Silicon Bicrystals Fabricated by a Modified Direct Bonding Technique
T. S. ArgunovaIoffe Physicotechnical Institute RASM. Yu. GutkinRussian Academy of SciencesL. S. KostinaT.V. KudriavtsevaEun Dong KimKorea Electrotechnology Research Institute (KERI)Sang Cheol KimKorea Electrotechnology Research Institute (KERI)
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomenabook series1999en
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