R.V. Nandedkar

1 ta ish

Raja Ramanna Centre for Advanced Technology

1. Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis

   M. K. Tiwari, B. Gowrishankar, Vikas Raghuvanshi +2

   Maqola20022 iqtibos

   ABIABI:AkademIndex/2026.other.179769