Maqola

Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis

M. K. TiwariSynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, IndiaB. GowrishankarSynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, IndiaVikas RaghuvanshiSynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, IndiaR.V. NandedkarSynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, IndiaKawal SawhneySynchrotron Utilization Section, Centre for Advanced Technology, 452 013, Indore, India

2002en

Ochiq kirish: yoʻq

ABI

Annotatsiya

Annotatsiya mavjud emas.

Identifikatorlar

DOI: 10.1007/bf02708023

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