О. Ф. Вывенко

2 ta ish

St Petersburg University

1. X-ray beam induced current—a synchrotron radiation based technique for the <i>in situ</i> analysis of recombination properties and chemical nature of metal clusters in silicon

   О. Ф. Вывенко, Tonio Buonassisi, A. A. Istratov +4

   Maqola20024 iqtibos

   ABIABI:AkademIndex/2026.other.500796

2. Regular Dislocation Networks in Silicon as a Tool for Nanostructure Devices used in Optics, Biology, and Electronics

   M. Kittler, Xuegong Yu, Teimuraz Mchedlidze +9

   Maqola20073 iqtibos

   ABIABI:AkademIndex/2026.other.666881