О. В. Александров

1 ta ish

Saint Petersburg State Electrotechnical University

1. Electrical properties of silicon layers implanted with erbium and oxygen ions in a wide dose range and thermally treated in different temperature conditions

   О. В. Александров, A. O. Zakhar’in, Н. А. Соболев +1

   Maqola20022 iqtibos

   ABIABI:AkademIndex/2026.other.558230