F.N. Cubaynes

1 ta ish

Philips (Finland)

1. Thickness and composition of ultrathin SiO2 layers on Si

   C. van der Marel, Marcel A. Verheijen, Y. Tamminga +3

   Maqola20042 iqtibos

   ABIABI:AkademIndex/2026.other.916500