M. Willander
2 ta ish
University of Gothenburg
Deep-level emissions influenced by O and Zn implantations in ZnO
Qiming Zhao, Peter Klason, M. Willander +3
Maqola20054 iqtibosABIMetal–semiconductor junctions on <i>p</i>-type strained Si1−<i>x</i>Ge<i>x</i> layers
Omer Nur, M. Willander, Raşit Turan +2
Maqola19962 iqtibosABI