Asosiy kontentga oʻtish

G. J. Tallents

3 ta ish

University of York

  1. Lithography at EUV wavelengths

    G. J. Tallents, E. Wagenaars, Geoff J. Pert

    Maqola20103 iqtibos
    ABI
  2. A Saturated X-ray Laser Beam at 7 Nanometers

    Jie Zhang, A. G. MacPhee, J.‐Y. Lin +10

    Maqola19972 iqtibos
    ABI