J. J. Kalandarov

1 ta ish

Oʻzbekiston Respublikasi Fanlar Akademiyasi

1. A compensation method for measuring the junction temperature of a p +-p-n + silicon structure

   O. A. Abdulkhaev, D. M. Yodgorova, A. V. Karimov +3

   MaqolaSemiconductor materials and interfacesInstruments and Experimental Techniques20133 iqtibos

   ABIABI:AkademIndex/2013.article.000163