Aurélian Crunteanu

1 ta ish

French National Centre for Scientific Research

1. Raman and XPS characterization of vanadium oxide thin films with temperature

   Ferran Ureña-Begara, Aurélian Crunteanu, Jean‐Pierre Raskin

   Maqola20173 iqtibos

   ABIABI:AkademIndex/2026.other.317679