Fouzi Douak

1 ta ish

Abbès Laghrour University of Khenchela

1. Role of non-uniform channel doping in improving the nanoscale JL DG MOSFET reliability against the self-heating effects

   H. Ferhati, Fouzi Douak, F. Djeffal

   Maqola20173 iqtibos

   ABIABI:AkademIndex/2026.other.397913