Jun-Sik Yoon

1 ta ish

Pohang University of Science and Technology

1. Systematic DC/AC Performance Benchmarking of Sub-7-nm Node FinFETs and Nanosheet FETs

   Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee +1

   Maqola20182 iqtibos

   ABIABI:AkademIndex/2026.other.374700