Jan Kehres

2 ta ish

Technical University of Denmark

1. Spectral correction algorithm for multispectral CdTe x-ray detectors

   Erik Schou Dreier, Jan Kehres, Mohamad Khalil +4

   Maqola20184 iqtibos

   ABIABI:AkademIndex/2026.other.381376

2. Material classification from sparse spectral X-ray CT using vectorial total variation based on L infinity norm

   Doniyor Jumanazarov, Jakeoung Koo, Jan Kehres +3

   Maqola20223 iqtibos

   ABIABI:AkademIndex/2026.other.381383