В. Ф. Валеев

1 ta ish

Kazan E. K. Zavoisky Physical-Technical Institute

1. Spectral Ellipsometry Study of Silicon Surfaces Implanted with Oxygen and Helium Ions

   В. В. Базаров, В. И. Нуждин, В. Ф. Валеев +1

   Maqola20192 iqtibos

   ABIABI:AkademIndex/2026.other.281584