Oralbay N. Yusupov

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AJINIYOZ NOMIDAGI NUKUS DAVLAT PEDAGOGIKA INSTITUTI

1. Defect Formation in MIS Structures Based on Silicon with an Impurity of Ytterbium

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   MaqolaOAOchiq kirishSemiconductor materials and interfacesEast European Journal of Physics20244 iqtibos

   ABIABI:AkademIndex/2024.article.001723