Kh.S. Daliev
30 ta ish
Oʻzbekiston Milliy Universiteti
Study of Defect Structure of Silicon Doped with Dysprosium Using X-Ray Phase Analysis and Raman Spectroscopy
Kh.S. Daliev, Sharifa B. Utamuradova, Jonibek J. Khamdamov +2
MaqolaOchiq kirish20242 iqtibosABI