Ikromjon U. Rakhmonov

1 ta ish

Islom Karimov nomidagi Toshkent davlat texnika universiteti

1. Thermal-Cycling-Induced Degradation Mechanisms at “Gel–Solid” Interfaces in High-Voltage Power Modules

   Xianfeng Li, Xinpei Wang, Wei Wang +5

   MaqolaOAOchiq kirish20260 iqtibos

   ABIABI:AkademIndex/2026.article.054807