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Thermal-Cycling-Induced Degradation Mechanisms at “Gel–Solid” Interfaces in High-Voltage Power Modules

Xianfeng LiNorth China Electric Power UniversityXinpei WangNorth China Electric Power UniversityWei WangState Grid Economic and Technological Research Institute Co., LtdWanshui YuChina Electric Power Research InstituteJian WangNorth China Electric Power UniversityIkromjon U. RakhmonovTashkent State Technical UniversityQingmin LiNorth China Electric Power UniversityFeng ZhouFeng Zhou is with Central South University

2026

Ochiq kirishGibrid

Litsenziya: cc-by

Manbada oʻqishdoi.org(yangi oynada ochiladi)

ABI

Annotatsiya

Annotatsiya mavjud emas.

Identifikatorlar

DOI: 10.1109/tpel.2026.3734507

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