Mursaleen Shahid

1 ta ish

1. Dose Dependent Amorphization and Trap Assisted Conduction in Gamma and X-Ray Irradiated SiO2: Structural and Electrical Evidence for Defect Engineering

   Renaldy Bernardo Saragih, Sherina Massayu Putri, Nikita Salshabila +5

   Maqola20260 iqtibos

   ABIABI:AkademIndex/2026.article.055108