Z. Miminoshvili

1 ta ish

Institute of Technical Electronics, Moscow, U.S.S.R

1. A secondary ion mass spectrometry study of two-layer systems based on tellurium

   В. А. Лабунов, B. Kolosnicin, D. Marton +1

   MaqolaPhase-change materials and chalcogenidesThin Solid Films19840 iqtibos

   ABIABI:AkademIndex/openalex/1984.article.000109