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A secondary ion mass spectrometry study of two-layer systems based on tellurium

В. А. ЛабуновRadiotechnical Institute, Minsk, U.S.S.RB. KolosnicinRadiotechnical Institute, Minsk, U.S.S.RD. MartonTechnical University, Budapest, HungaryZ. MiminoshviliInstitute of Technical Electronics, Moscow, U.S.S.R

Thin Solid Filmsjournal1984en

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Annotatsiya mavjud emas.

Mavzular

Phase-change materials and chalcogenides Semiconductor materials and interfaces Semiconductor materials and devices

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DOI: 10.1016/0040-6090(84)90505-4

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