Nobuhiro Hata

1 ta ish

Thin Film Silicon Solar Cells Super Laboratory, Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, Japan

1. Light-Induced Degradation Effects in a-Si:H Observed by Raman Scattering Measurements

   Paul Stradins, Michio Kondo, Nobuhiro Hata +1

   MaqolaThin-Film Transistor TechnologiesMRS Proceedings19980 iqtibos

   ABIABI:AkademIndex/openalex/1998.article.000157