A.J. Akbarov

1 ta ish

Tashkentskij Gosudarstvennyj Univ., Tashkent (Uzbekistan)

1. Capacitance transient spectroscopy of radiation defects on Si-SiO 2 interface of silicon mis-structures

   Kh.Sh. Daliev, Sharifa B. Utamuradova, A.J. Akbarov

   MaqolaSilicon and Solar Cell Technologies19990 iqtibos

   ABIABI:AkademIndex/openalex/1999.article.000271