Padha Nikolava Philipova

1 ta ish

Bulgarian Academy of Sciences

1. Reliability of 4H-SiC p-n Diodes on LPE Grown Layers

   G. Sarov, Roumen Kakanakov, T. Cholakova +6

   MaqolaSilicon Carbide Semiconductor TechnologiesMaterials science forum20030 iqtibos

   ABIABI:AkademIndex/openalex/2003.article.000241