S. F. Li

1 ta ish

Braunschweig University of Technology 1 Institute of Semiconductor Technology, , 38106 Braunschweig, Germany

1. Photoassisted Kelvin probe force microscopy at GaN surfaces: The role of polarity

   Jiandong Wei, S. F. Li, A. É. Atamuratov +2

   MaqolaForce Microscopy Techniques and ApplicationsApplied Physics Letters20100 iqtibos

   ABIABI:AkademIndex/openalex/2010.article.000061