K. Rohlena

1 ta ish

Institute of Physics, ASCR, v.v.i

1. Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources

   J. Krása, L. Láska, K. Rohlena +5

   MaqolaIon-surface interactions and analysisRadiation effects and defects in solids20100 iqtibos

   ABIABI:AkademIndex/openalex/2010.article.000177