Jonibek J. Hamdamov

2 ta ish

Institute of Semiconductor Physics and Microelectronics at the National University of Uzbekistan, Tashkent, Uzbekistan

1. Structure Determination and Defect Analysis n-Si<Lu>, p-Si<Lu> Raman Spectrometer Methods

   Khodjakbar S. Daliev, Sharifa B. Utamuradova, Zavkiddin E. Bahronkulov +2

   MaqolaSilicon Nanostructures and PhotoluminescenceEast European Journal of Physics20238 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.121943

2. Investigation of the Magnetic Properties of Silicon Doped with Rare-Earth Elements

   Khodjakbar S. Daliev, Zavkiddin E. Bahronkulov, Jonibek J. Hamdamov

   MaqolaMagnetic Field Sensors TechniquesEast European Journal of Physics20238 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.121944