Sardor Eshboboyev

1 ta ish

Karshi State University,Karshi,Uzbekistan

1. Raman and IR Spectrum Analysis of CrSi2 Thin Films Formed in Direct Current and Variable Frequency Modes of a Magnetron Sputtering Device

   K.T. Dovranov, Maksim Vinnichenko, V.V. Korablev +3

   MaqolaChalcogenide Semiconductor Thin Films20242 iqtibos

   ABIABI:AkademIndex/openalex/2024.article.003101