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Maksim Vinnichenko

5 ta ish

Peter the Great St. Petersburg Polytechnic University,Saint Petersburg,Russian Federation

  1. Raman and IR Spectrum Analysis of CrSi2 Thin Films Formed in Direct Current and Variable Frequency Modes of a Magnetron Sputtering Device

    K.T. Dovranov, Maksim Vinnichenko, V.V. Korablev +3

    MaqolaChalcogenide Semiconductor Thin Films20242 iqtibos
    ABI

  2. Obtaining Thin Films from Semiconductor Compounds and Their X-Ray Analysis

    K.T. Dovranov, Maksim Vinnichenko, Asilbek Kodirov +6

    MaqolaSurface and Thin Film Phenomena20242 iqtibos
    ABI

  3. Photoinduced Absorption Spectrum of GeSi/Si Quantum Dots in the Mid-IR and Terahertz Ranges under Resonant and Non-resonant Optical Pumping

    Danila Kararulov, Ratmir V. Ustimenko, G A Melentev +6

    MaqolaPhotonic and Optical Devices20240 iqtibos
    ABI

  4. Electrophysical Properties and Surface Characteristics of BaTiO <sub>3</sub> Thin Films Produced by Ion-Plasma Method

    K.T. Dovranov, Muradulla Normuradov, I. R. Bekpulatov +6

    MaqolaFerroelectric and Piezoelectric Materials20250 iqtibos
    ABI

  5. Surface Morphology of Ni/GaAs Thin Films Produced by Ion-Plasma Method

    K.T. Dovranov, Shakhnoza Jurayeva, Muradulla Normuradov +6

    MaqolaSurface Roughness and Optical Measurements20250 iqtibos
    ABI