Devices and Methods of Measurements
3 ta ish
Jurnal · ISSN 2220-9506
Disordered Tin Oxide Films for Thermoelectric Applications: Correlation between Microstructure, Electrical Conductivity and Seebeck Coefficient
V.K. Ksenevich, V.A. Dorosinets, M. V. Samarina +4
MaqolaOchiq kirishAdvanced Thermoelectric Materials and DevicesDevices and Methods of Measurements20250 iqtibosABI