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Effect of grain boundary scattering on the TCR of thin tin films

C. R. PichardYu. F. KomnikPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov, Ukrainian SSRБ. И. БелевцевPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov, Ukrainian SSRA. J. Tosser

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