Ushbu ish iqtibos qilgan ishlar

12 ta ish

Ish: Effect of grain boundary scattering on the TCR of thin tin films

1. The mean free path of electrons in metals

   E. H. Sondheimer

   Maqola19523 iqtibos

   ABIABI:AkademIndex/2026.other.603980

2. Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

   A. F. Mayadas, M. Shatzkes

   Maqola19703 iqtibos

   ABIABI:AkademIndex/2026.other.603983

3. Thin Film Phenomena

   K. L. Chopra, Julius Klerrer

   MaqolaOAOchiq kirish19702 iqtibos

   ABIABI:AkademIndex/2026.other.022642

4. Statistical model of electrical conduction in polycrystalline metals

   C. R. Tellier, C.P. Pichard, A. J. Tosser

   Maqola19792 iqtibos

   ABIABI:AkademIndex/2026.other.603979

5. A three-dimensional model for grain boundary resistivity in metal films

   C. R. Pichard, C. R. Tellier, A. J. Tosser

   Maqola19792 iqtibos

   ABIABI:AkademIndex/2026.other.603981

6. Description of electronic transport properties of monocrystalline films by a statistical model

   C. R. Tellier, A. J. Tosser

   Maqola19802 iqtibos

   ABIABI:AkademIndex/2026.other.603982

7. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.603978

8. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.603984

9. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.603985

10. Sarlavhasiz

    Boshqa1 iqtibos

    ABIABI:AkademIndex/2026.other.603986

11. Sarlavhasiz

    Boshqa1 iqtibos

    ABIABI:AkademIndex/2026.other.603987

12. Relationship of electrical resistance of polycrystalline tin films to structural characteristics

    Б. И. Белевцев, Yu. F. Komnik, V. E. Kopina +1

    MaqolaCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics19801 iqtibos

    ABIABI:AkademIndex/2026.other.603988