Asosiy kontentga oʻtish
Maqola

Low Temperature Phase Transition (Pt) and Defect Formation (Df) in Silicon with Dioxide Inclusions Under X-Ray Irradiation

Sh. MakhkamovInstitute of Nuclear Physics, Uzbekistan Academy of Sciences, Tashkent, 702132, UzbekistanS. N. AbdurakhmanovaInstitute of Nuclear Physics
MRS Proceedingsjournal1995en

Ochiq kirish: yoʻq

ABI

Annotatsiya

Annotatsiya mavjud emas.

Mavzular

Identifikatorlar

Iqtiboslar va manbalar