Ushbu ish iqtibos qilgan ishlar

4 ta ish

Ish: Low Temperature Phase Transition (Pt) and Defect Formation (Df) in Silicon with Dioxide Inclusions Under X-Ray Irradiation

1. Defects in Irradiated Silicon: Electron Paramagnetic Resonance of the Divacancy

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   ABIABI:AkademIndex/2026.other.360543

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3. Sarlavhasiz

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