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Theoretical description of high-temperature implantation of silicon carbide with N+ and Al+ ions

D. V. KulikovPhysicotechnical InstituteYu. V. TrushinRossendorf Research Center, Dresden, GermanyR.A. YankovIlmenau Technical University, Ilmenau, GermanyJ. PezoldtRossendorf Research Center, Dresden, GermanyW. SkorupaRossendorf Research Center, Dresden, Germany
Technical Physics Lettersjournal1998en

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A theoretical analysis is made of the evolution of the defect structure in silicon carbide (6H-SiC) implanted with N+ and Al+ ions of various energies. Satisfactory agreement was achieved between the calculated defect distributions and the experimental data. The following kinetic parameters of silicon carbide were estimated numerically: the migration energy of interstitial silicon atoms and the recombination parameters of vacancies and interstitial sites in the carbon and silicon subsystems.

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