Ushbu ish iqtibos qilgan ishlar

5 ta ish

Ish: Reliability of 4H-SiC p-n Diodes on LPE Grown Layers

1. 4H-SiC Layers Grown by Liquid Phase Epitaxy on 4H-SiC Off-Axis Substrates

   N.I. Kuznetsov, Andrey Morozov, D. A. Bauman +8

   MaqolaOAOchiq kirishSilicon Carbide Semiconductor TechnologiesMaterials science forum20002 iqtibos

   ABIABI:AkademIndex/2000.article.000164

2. Electrical Characteristics of 4H-SiC pn Diode Grown by LPE Method

   N.I. Kuznetsov, D. A. Bauman, A.V. Gavrilin +1

   MaqolaOAOchiq kirishSilicon Carbide Semiconductor TechnologiesMaterials science forum20022 iqtibos

   ABIABI:AkademIndex/2002.article.000200

3. Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes

   Peder Bergman, H. Lendenmann, Per Åke Nilsson +2

   Maqola20012 iqtibos

   ABIABI:AkademIndex/2026.other.659152

4. Long Term Operation of 4.5kV PiN and 2.5kV JBS Diodes

   H. Lendenmann, Fanny Dahlquist, Nils Johansson +4

   Maqola20012 iqtibos

   ABIABI:AkademIndex/2026.other.659153

5. Sarlavhasiz

   Boshqa2 iqtibos

   ABIABI:AkademIndex/2026.other.659154