Asosiy kontentga oʻtish
AkademIndex

Xizmatlar

Maqola

Investigation of γ-radiation defect formation at the Si-SiO 2 interface

S.Z. ZaynabidinovSh. Kh. YulchievР. АлиевAndijan State University Andijan Uzbekistan
2004en

Ochiq kirish: yoʻq

ABI

Annotatsiya

Annotatsiya mavjud emas.

Mavzular

Integrated Circuits and Semiconductor Failure AnalysisSilicon and Solar Cell TechnologiesIon-surface interactions and analysis

Iqtiboslar va manbalar

0 ta iqtibos0 ta foydalanilgan manba