Measurement of efficient thickness of transition layer, stimulated by microwave radiation, in contacts Mo-GaAs
A. B. KamalovCombined Institute of Natural Sciences of the Karakalpak Branch of the Academy of Sciences of the Republic of Uzbekistan, Nukus, Uzbekistan
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Using method of Auger electronic spectroscopy, we experimentally research an influence of microwave treatment on efficient thickness modification in transition layer of Mo-GaAs contacts. It is shown that parameters of Schottky barriers (barriers height ϕ B and ideality factor n) are correlated with efficient thickness of transition layer after microwave treatment.
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