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Research of Spectral Characteristics of a Thin-Film Structure with a Metal-Semiconductor Barrier

A. V. KarimovPhysics-Technical Institute Scientific and Production Association “Physics – Sun” of the Academy of Sciences of the Republic of Uzbekistan. 100084, Tashkent, Chingiz Aitmatov st. -2BD. M. YodgorovaPhysics-Technical Institute Scientific and Production Association “Physics – Sun” of the Academy of Sciences of the Republic of Uzbekistan. 100084, Tashkent, Chingiz Aitmatov st. -2BF. A. GiyasovaPhysics-Technical Institute Scientific and Production Association “Physics – Sun” of the Academy of Sciences of the Republic of Uzbekistan. 100084, Tashkent, Chingiz Aitmatov st. -2B

Frontiers in Optics + Laser Science APS/DLSjournal2019en

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ABI

Annotatsiya

The paper presents photosensitive sandwich-structured Au-vGaAs: O-nCdS-nInP- Au-semiconductor formed by vacuum deposition of thin films of cadmium sulfide and indium phosphide on a single-crystal substrate of gallium arsenide.

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Mavzular

Surface Roughness and Optical Measurements

Identifikatorlar

DOI: 10.1364/fio.2019.jtu3a.20

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