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Ish: Dose Dependent Amorphization and Trap Assisted Conduction in Gamma and X-Ray Irradiated SiO2: Structural and Electrical Evidence for Defect Engineering
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26 ta ish
Ish: Dose Dependent Amorphization and Trap Assisted Conduction in Gamma and X-Ray Irradiated SiO2: Structural and Electrical Evidence for Defect Engineering